Self-impact of NBTI effect on the degradation rate of threshold voltage in PMOS transistors

B. Eghbalkhah | S. A. K. Gharavi | Ali Afzali-Kusha | M.B. Ghaznavi-Ghoushchi

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URL :   http://research.shahed.ac.ir/WSR/WebPages/Report/PaperView.aspx?PaperID=10151
Date :  2013/03/28
Publish in :    International Conference on Design & Technology of Integrated Systems in Nanoscale Era
DOI :  https://doi.org/10.1109/dtis.2013.6527796
Link :  http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6527796
Keywords :Self-impact, effect, degradation, threshold, voltage, transistors

Abstract :

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http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6527796