Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits

Behzad Eghbalkhah | Mehdi Kamal | Hassan Afzali-Kusha | Ali Afzali-Kusha | M.B. Ghaznavi-Ghoushchi | Massoud Pedram

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URL :   http://research.shahed.ac.ir/WSR/WebPages/Report/PaperView.aspx?PaperID=30931
Date :  2015/07/01
Publish in :    Microelectronics Reliability
DOI :  https://doi.org/10.1016/j.microrel.2015.06.004
Link :  http://www.sciencedirect.com/science/article/pii/S0026271415001341
Keywords :temperature, dependent, lifetime

Abstract :

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