Very High Speed and Low Voltage Open-Loop Dual Edge Triggered Sample and Hold Circuit in 0.18um CMOS Technology

M. Hassan Sagha | Mohsen Jalali

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URL :   http://research.shahed.ac.ir/WSR/WebPages/Report/PaperView.aspx?PaperID=7463
Date :  2012/09/20
Publish in :    IEEE International Conference on Semiconductor Electronics


Keywords :Speed, Voltage, CMOS

Abstract :

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